Standard Test Method for
Radiologic Examination of Semiconductors and Electronic
Components1
This general is issued under the fixed designation e 1161; the range right now following the designation suggests the 12 months of
unique adoption or, in the case of revision, the year of last revision. quite a number in parentheses indicates the year of remaining reapproval. a
superscript epsilon (e) shows an article change for the reason that closing revision or reapproval.
click below to download Astm E 1161 – 03 pdf free
[sdm_download id="6585" fancy="0" color="green"]
click here to download Astm E 1160 – 87 (Reapproved 2001) pdf free
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